Hybrid six-degree-of-freedom nano-scale precision positioning platform system ，TWI425334，Wen-Yuh Jywe;Jin-Zhong Shen;Chien-Hung Liu;Jia-Hong Wu;Qun-Zhong Lu;Ying-Dai Yu , 2014/02/01
Signal measurement system with dual grating ，TWI414756 ，Wen-Yu Jywe;
Chien-Hung Liu ; Yun-Feng Deng; Bo-Yu Chen，2013/11/11
Manufacturing-process equipment，US8575791 B2，Wen-Yuh Jywe,Jing-Chung Shen,Chin-Tien Yang,Chien-Hung Liu,Jau-Jiu Ju,Chia-Hung Wu,Chun-Chieh Huang,Lili Duan,Yuan-Chin Lee，2013/11/5
Nanoscale piezoelectric alignment platform mechanism with two degrees of freedom ，TWI410295，Wen-Yu Jywe;Chien-Hung Liu ; Yun-Feng Deng; Bo-Yu Chen，2013/10/01
Spherical lens testing device for precision machine ，TWI404910，Wen-Yu Jywe;Dong-Hui Xu;Chien-Hung Liu;Zi-Hao Lin;Yu-Shan Lin，2013/08/11
Laser direct-writing type manufacturing apparatus for nano periodic structure pattern ，TWI405049，Wen-Yuh Jywe;Jing-Chung Shen ;Chin-Tien Yang;Chien-Hung Liu;Jau-Jiu Ju;Chia-Hung Wu;Chun- Chieh Huang;Lili Duan;Yuan-Chin Lee，2013/08/11
Dynamic path detection method for five-axis machine tool and device thereof，TWI405057，Chien-Hung Liu;
Jywe Wen-Yu Jywe;Yi-Zong Li，2013/08/11
Device for detecting multi-axis errors of pick-and-place mechanism by utilizing split beam ，TWI401420，Wen-Yu Jywe;Chien-Hung Liu;Dong-Hui Xu;Yu-Shan Lin;Li-Li Duan，2013/07/11
Apparatus applied to pick-and-place mechanism positioning and angle error of single light source inspection and testing，TWI401554，Wen-Yu Jywe;Chien-Hung Liu ;Dong-Hui Xu;Yu-Shan Lin;Li-Li Duan，2013/07/11
Device and method of using laser interferometer for detecting angle error，TWI398622，Wen-Yuh Jywe;Deng-Yu Yang;Chien-Hung Liu;Tung-Hui Hsu;I-Ching Chen，2013/06/11
Straightness error measurement device ，TWI398877，Chien-Hung Liu ;Wen-Yu Jywe;Jun-Yao Huang，2013/06/11
Framework for measuring thickness and refraction index of transparent substrate ，TWI390174，Chien-Hung Liu;Wen-Yu Jywe;Xin-He You;Wei-Quan Huang; Zhong-Xiang Zheng; Hao-Wen Zhang;Guan-Hong Ye;Zhong-You Liu，2013/03/21
Device for measuring linear frictional resistance ，TWI390198，Wen-Yu Jywe;Chien-Hung Liu ; Yun-Feng Deng;Dong-Xian Xie;Cheng-Hong Cai; Zhe-Xu Feng;Xin-Zheng Chen ，2013/03/21
Device for measuring the error of pick-up mechanism by using split light beam and dynamic sensor ，TWI388030，Wen-Yu Jywe;Chien-Hung Liu ;Dong-Hui Xu;Yu-Shan Lin;Li-Li Duan，2013/03/01
Non-contact measurement method for thread shape of lead screw and screw nut and its device，TWI385355，Wen-Yu Jywe;Chien-Hung Liu ; Li-Li Duan; Xue-Liang Huang; Jia-Tai Wu，2013/02/11
Device of applying a single light source to detect dual axis errors of a pick-and-place mechanism，TWI384196，Wen-Yu Jywe;Chien-Hung Liu;Dong-Hui Xu;Yu-Shan Lin;Ren-Jie Fang;Min-De Yang;Li-Li Duan，2013/02/01
Device and method of using laser light source for scanning scrapped surface ，TWI383125，Wen-Yuh Jywe; Chien-Hung Liu;Hung- Shu Wang;Chia-Hung Wu;Bo-Wei Chen;Wei-Cheng Tsai;Wei-Chung Chang;Meng-Tse Lee，2013/01/21
Measurement system for alignment and level adjustment of embossing platform ，TWI383466，Wen-Yu Jywe; Chien-Hung Liu;Hong-Guang Chen;Dong-Xian Xie ;Yun-Feng Deng，2013/01/21
Detecting assembly for a multi-axis machine tool，EP2340914 B1，Wen-Yuh Jywe,Chien-Hung Liu,Tung-Hui Hsu,Chia-Ming Hsu，2012/12/26
Two stage type long stroke nano-scale precision positioning system. ，TWI379732，Wen-Yu Jywe;Chien-Hung Liu;Jin-Zhong Shen;Bo-Zheng Lin;Jia-Hong Wu; Chien-Hung Liu;Li-Li Duan;Dong-Xian Xie;Dong-Xing Xie;Yi Jing Chen;Ren-Jie Fang，2012/12/21
Measurement device for multi-axis machine tool，TWI378843 (B)EP2340914 (A1)EP2340914 (B1)JP2011137812 (A)JP5038481 (B2)，Wen-Yu Jywe;Chien-Hung Liu;Dong-Hui Xu;Jia-Ming Xu，2012/12/11
Optical ruler system having five degrees of freedom，TWI414747，Chien-Hung Liu;Zhong-Xian Zheng，2012/11/16
A contactless vibration measurement device ，TWI372857，Wen-Yuh Jywe;Chien-Hung Liu;Dong-Xian Xie;
Xin-Hao Deng;Yun-Feng Deng;Xin-Zheng Chen;Cheng-Hong Cai，2012/09/21
Static torque measurement device for linear motion unit ，TWI361886，Wen-Yu Jywe;Chien-Hung Liu;YunFengDeng;Dong-Xian Xie;Cheng-Hong Cai;Zhe-Xu Feng;Xin-Zheng Chen，2012/04/11
Method of detecting a dynamic path of a five-axis machine tool and detecting assembly for the same，US8116902 B2，Chien-Hung Liu,Wen-Yuh Jywe,Yi-Tsung Li，2012/2/14
Automatic scan and mark apparatus，US8111405 B2，Wen-Yuh Jywe,
Chien-Hung Liu,
Hung-Shu Wang,Bo-Wei Chen,Jyun-Jia Yang,Wei-Cheng Tsai,Wei-Chung Chang,Ming-Chi Chiang,Jia-Hong Chen，2012/2/7
Parallel measuring apparatus among transparent body and reflection body and method thereof ，TWI345624，Chien-Hung Liu;Wen-Yuh Jywe;Xian-Chang Ye;Zhi-Peng Wang;Shu-Hao Zheng;Kai-Zhang Lin;Jun Zhao;Zong-Xian Zheng;Han-Xing Huang;Zhi-HaoZhang，2011/07/21
Five-axis tool machine detection device，TWI340679，Wen-YuJywe;Chien-Hung Liu;Yi-Zong Li ;Dong-Xian Xie ;Dong-Hui Xu ;Hong-Shu Wang，2011/04/21
Detecting assembly for a multi-axis machine tool，US7852478 B1，Wen-Yuh Jywe,Chien-Hung Liu,Tung-Hui Hsu,Chia-Ming Hsu，2010/12/14
Means for measuring a working machine's structural deviation from five reference axes，US7773234 B2，Wen-Yuh Jywe,Chien-Hung Liu,Yi-Tsung Li,Tung-Hsien Hsieh,Tung-Hui Hsu,Hung-Shu Wang，2010/8/10
System for detecting error of multi-axis processing machine and method thereof ，TWI326630，Wen-Yuh Jywe;
Chien-Hung Liu;Dong-Hui Xu; You-Ren Zheng;Yi-Zong Li，2010/07/01
Parallelism measurement device for movements on linear slide-rail ，TWI326746，Wen-Yuh Jywe;Chien-Hung Liu;Dong-Xian Xie;Yun-Feng Deng，2010/07/01
Device for sensing positioning error of pick-and-place mechanism by applying dynamic sensor，TW201012607，Wen-Yuh Jywe;Chien-Hung Liu;Dong-Hui Xu;Yu-Shan Lin;Ren-Jie Fang;Min-De Yang;Li-Li Duan，2010/04/01
A thickness measuring system with astigmatic method for transparent and semi-transparent objects ，TWI318681，Chien-Hung Liu;Wen-Yuh Jywe;De-Hua Fang;Liang-Wen Ji;Zong-Han Li;Xian-Chang Ye，2009/12/21
Heat dissipation seat ，TWI315781，Xian-ZhongCheng;Wen-Yuh Jywe;Chien-Hung Liu;Te-Hua Fang;Yan-Zhan Wang，2009/10/11
All-electric nanoscale imprinter ，TWI312730，Chien-Hung Liu;
Wen-Yuh Jywe;
Cai-Yuan Chen;
Rui-Hong Chen;
Wan-Jun Zhao;Kai-Zhang Lin;Zhi-Hao Zhang;Zhao-Heng Liu;Han-Xing Huang ;Shu-Hao Zheng;Zong-Xian Zheng，2009/08/01
Static/dynamic multi-function measuring device for linear unit，US7636170 B1，Wen-Yuh Jywe,Chien-Hung Liu,Tung-Hsien Hsieh,Yun-Feng Teng，2008/9/12
A nano-grade 3-DOF micro platform mechanism，TWI300733，Chien-Hung Liu;Wen-Yuh Jywe;Yi-Zong Li;Dong-Hui Xu;Hong-Shu Wang，2008/09/11
3-DOF Z-tilts nano-platform and its measuring system，TW20060148762，Chien-Hung Liu，Wen-Yuh Jywe;De-Hua Fang;Liang-Wen Ji;Tsai-Yuan Chen;Jia-Hung Wu;Hung-Shu Wang，2008/7/7
A system for detecting errors of a one-dimensional five degrees of freedom(DOF) system，TWI292816，Chien-Hung Liu;Wen-Yuh Jywe;Qi-Chen Xie;Dong-Xian Xie;Chen-Xue Hong;Jun-Hao Huang;Dong-Hui Xu，2008/01/21
Non-contact bidirectional laser probe ，TWI292817，Chien-Hung Liu;Wen-Yuh Jywe;Te-Hua Fang;Liang-Wen Ji;Chao-Gui Chen;Zhi-Peng Wang;Wei-Quan Huang;Zhao-Fan Chen;Zong-Wei Liao，2008/01/21
A system for detecting errors of a one-dimensional five degrees of freedom(DOF) system ，TWI292816，Chien-Hung Liu；Wen-Yuh Jywe;Qi-Chen Xie;Dong-Xian Xie;Chen-Xue Hong;Jun-Hao Huang;Dong-Hui Xu，2008/01/21
Non-contact bidirectional laser probe ，TWI292817，Chien-Hung Liu;Wen-Yuh Jywe;De-Hua Fang;Liang-Wen Ji;Chao-Gui Chen;Zhi-Peng Wang; Wei-Quan Huang; Zhao-Fan Chen; Zong-Wei Liao，2008/01/21
Mechanism to eliminate the backlash of servo motor ，M324344，Wen-Yuh Jywe;Chien-Hung Liu;Yu-Ying Chiou，2007/12/21
Nano-scaled error-inspecting system of rotary shafts ，M323050，Chien-Hung Liu;Wen-Yuh Jywe;Wen-Shiang Lin，2007/12/01
Highly precise two-stage triangulation laser con-focal probe ，TWI290211，Chien-Hung Liu;
Wen-Yuh Jywe;De-Hua Fang;Liang-Wen Ji;Chao-Gui Chen;Zhi-Peng Wang;Jian-Ping Liu;Yu-Xiang Wang;Yang-Dong Chen，2007/11/21
Aligning mechanism ，M321342，Wen-Yuh Jywe;Chien-Hung Liu;Yu-Ying Chiou，2007/11/01
Vibration measuring system with two axes and six degree of freedom ，TWI287613，Chien-Hung Liu;Wen-Yuh Jywe;Liang-Wen Ji;Dung-Shian Shie;Hung-Shu Wang;Chi-Chen Shie;Dung-Huei Shiu;Te-Hua Fang，2007/10/01
System and method is used with theory of optical aberration for measuring free camber ，TWI287614，Chien-Hung Liu;Wen-Yuh Jywe;Zhi-Peng Wang;Liang-Wen Ji;Te-Hua Fang，2007/10/01
Measuring error method for high precision and nano-scale rotation axis and the apparatus thereof ，TWI287616，Chien-Hung Liu;Wen-Yuh Jywe;Te-Hua Fang;Liang-Wen Ji;Hsueh-Liang Huang;Shing-Ju Wu;Wang Hung-Shu，2007/10/01
Testing method of the straightness error using double-beam laser diffraction meter and the system thereof，TWI287617，Chien-Hung Liu;Wen-Yuh Jywe;Meng-Qian Li;Dong-Hui Xu;Te-Hua Fang，2007/10/01
4 drive alignment platform ，M319503，Wen-Yuh Jywe;Chien-Hung Liu;Yu-Ying Chiou，2007/09/21
High precision rotation revolving thermal deformation measurement system ，TWI285254，Chien-Hung Liu;Wen-Yuh Jywe;Yun-Feng Teng;Chang-Tian Qiu;Hong-Shu Wang，2007/08/11
Device for measuring rotation axis error using cat's-eye reflector，TWI283736，Chien-Hung Liu;Wen-Yuh Jywe;Yi-Xin Lin;Hsueh-Liang Huang，2007/07/11
Optical measurement unit for real-time measuring angular error of platform and the method thereof ，TWI274139，Chien-Hung Liu;Wen-Yuh Jywe;Chi-Chen Shie;Dung-Huei Shiu，2007/02/21
Tri-axis vibration measuring device adopting cube corner prism and quadrant sensor to establish nano-resolution ，TWI271513，Wen-Yuh Jywe;Chien-Hung Liu;Dung-Shian Shie;Chi-Chen Shie，2007/01/21
Dual-axis and five degree-of-freedom measuring device and method ，TWI263036，Wen-Yuh Jywe;Chien-Hung Liu;Yun-Feng Teng;Shiou-De Lin ，2006/10/01
Error-measuring apparatus for nano-scale rotary axis，TWI260394，Wen-Yuh Jywe;Chien-Hung Liu;Shing-Ju Wu;Hsueh-Liang Huang，2006/08/21
A real time straightness error measuring method for a moving stage，200617364，Chien-Hung Liu;Wen-Yuh Jywe;Hau-Wei Li，2006/06/01
Diffractive positioning 5-degree of freedom measuring device that uses optical interference and diffractive theories ，TWI249609，Wen-Yuh Jywe;Chien-Hung Liu;Lung-Tien Li，2006/02/21
Diffractive angle positioning multi-degree of freedom measuring device ，TWI249610，Wen-Yuh Jywe;Chien-Hung Liu;Lung-Tien Li;Hsueh-Liang Huang，2006/02/21
Optical revolving spindle error measurement device，TWI247095，Wen-Yuh Jywe;Chien-Hung Liu;Yi-Shin Lin;Lung-Tien Li，2006/01/11
Device for measuring linear dual axis geometric tolerances ，I245878，Wen-Yuh Jywe;Chien-Hung Liu;Hsueh-Liang Huang，2005/12/21
Diffraction-type triangular laser pickup head and error inspection method thereof ，TWI243888，Wen-Yuh Jywe;Chien-Hung Liu;Chau-Guei Chen;Chung J Chiang;Jian-Che Suen，2005/11/21
A kind of apparatus using transmission grating to measure rotation axis errors ，TWI239385，Wen-Yuh Jywe ;
Chien-Hung Liu;Jiun-Ren Chen;Jr-Wei Lian，2005/09/11
Device for measuring on a 2D plane with optical ruler measuring technique combined with atomic force probe ，TWI235228，Wen-Yuh Jywe;Rung-Ching Lin;Chien-Hung Liu;Jing-Tang Jou;Jiun-Ren Chen，2005/07/01
Miniature arbor revolving precision measurement device ，TWI235233，Wen-Yu Jywe;Chien-Hung Liu;Hau-Wei Li，2005/07/01
Optical real-time measurement method and system with single-axis, 6 degrees of freedom ，TWI232923，Wen-Yuh Jywe ;Chien-Hung Liu;Cheng-Chun Hsu，2005/05/21
A three-dimensional measuring system for vibration and displacement using quadrant detector and laser diode，TWI231365，Wen-Yu Jywe;Chien-Hung Liu;Jing-Tang Jou，2005/04/21
A device and method of reflective diffraction grating measure revolving spindle ，TWI220688，Wen-Yuh Jywe;
Chien-Hung Liu;Chih-Wei Lien，2004/09/01
System capable of measuring five degrees of freedom signals ，591199，Wen-Yuh Jywe;Chien-Hung Liu;Lung-Tian Li;Rung-Ching Lin;Ming-Kuen Tsai，2004/06/11
Simplified glass thickness measurement system ，591203，Wen-Yuh Jywe;Chien-Hung Liu,Chih-Wei Lien，2004/06/11
A 3D measuring system using diffraction grating interfere interferometry technique ，588152，Wen-Yuh Jywe;
Chien-Hung Liu;Lung-Tien Li，2004/05/21
Ring grating type rotational axis measurement system with 5 degrees of freedom ，585988，Wen-Yuh Jywe;
Chien-Hung Liu;Rung-Ching Lin;Yun-Feng Deng;Kai-An Jeng，2004/05/01
Measurement system with 6 degrees of freedom by 2D optical rule ，201878，Wen-Yu Jywe;Chien-Hung Liu;Kai-An Jeng;Yun-Feng Deng;Dung-Huei Shiu，2004/05/01
Measurement system with four degrees of freedom built through the optical grating diffraction principle ，201880，Wen-Yu Jywe;Chien-Hung Liu;Jiun-Ren Chen;Jau-Guei Chen，2004/05/01
Method using a grid encoder to detect error of platform of six-degree of freedom ，201367，Wen-Yu Jywe;Chien-Hung Liu ;Dung-Huei Shiu;Jing-Tang Jou ;Kai-An Jeng，2004/04/21